Implementing register array (ra) repair using lbist
AssigneeInternational Business Machines Corporation
InventorsSteven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer, Phillip A. Senum
Life of this patent
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Abstract
A method and circuit for implementing register array repair using Logic Built In Self Test (LBIST), and a design structure on which the subject circuit resides are provided. Register array repair includes identifying and creating a list of any repairable Register Arrays (RAs) that effect an LBIST fail result. Next a repair solution is detected for each of the repairable Register Arrays (RAs) isolating a failing location for the detected repair solution for each array.
Claims20
A circuit for implementing register array repair using Logic Built In Self Test (LBIST), said circuit comprising:
- a plurality of Register Arrays (RAs), each RA including a redundant element enabling a single repair;
- a list of any repairable Register Arrays (RAs) effecting an LBIST fail result being identified;
- and
- a repair solution being detected for each of the repairable Register Arrays (RAs) in the list for isolating a failing location for the detected repair solution for each array.
A design structure embodied in a non-transitory machine readable medium for designing, manufacturing, or testing an integrated circuit, the design structure comprising:
- a circuit tangibly embodied in the non-transitory machine readable used in a design process, said circuit for implementing register array repair using Logic Built In Self Test (LBIST), said circuit comprising:
- a plurality of Register Arrays (RAs), each RA including a redundant element enabling a single repair;
- a list of any repairable Register Arrays (RAs) effecting LBIST fail result being identified;
- and
- a repair solution being detected for each of the repairable Register Arrays (RAs) in the list for isolating a failing location for the detected repair solution for each array, wherein the design structure, when read and used in the manufacture of a semiconductor chip produces a chip comprising said circuit.
A method for implementing register array repair using Logic Built In Self Test (LBIST), said method comprising:
- providing a plurality of Register Arrays (RAs), each RA including a redundant element enabling a single repair;
- identifying and creating a list of any repairable Register Arrays (RAs) that effect LBIST fail result;
- detecting a repair solution for each identified repairable Register Arrays (RAs) in the list, and isolating of a failing location for the detected repair solution for each array.
Dependencies are inferred from the claim text.