Method and Device for Inspecting an Optoelectronic Component

A method for inspecting at least one optoelectronic component arranged on a connection board, the method comprising:

• exciting at least one electromagnetic resonant circuit, formed by the at least one optoelectronic component and the connection board, such that the at least one optoelectronic component emits electromagnetic radiation,
• wherein exciting the electromagnetic resonant circuit comprises applying an electrical alternating voltage in the electromagnetic resonant circuit by generating a temporally variable electromagnetic alternating field by a first coil and a second coil, wherein the first coil and the second coil are movable with respect to the connection board.

A method for inspecting at least one optoelectronic component arranged on a connection board, the method comprising:

• exciting at least one electromagnetic resonant circuit, formed by the at least one optoelectronic component and the connection board, such that the at least one optoelectronic component is excited to emit electromagnetic radiation;
• and
• measuring at least one electro-optical property of the at least one optoelectronic component, wherein exciting the electromagnetic resonant circuit comprises applying an electrical alternating voltage in the electromagnetic resonant circuit by generating a temporally variable electromagnetic alternating field by a flat coil.

A device for inspecting an optoelectronic component, the device comprising:

• a connection board on which the optoelectronic component to be measured is arranged;
• and
• means for exciting an electromagnetic resonant circuit, which comprises the connection board and the optoelectronic component, wherein the means comprises a first coil and a second coil or wherein the means comprises a flat coil.