Device and method for determining a parameter of a transformer
AssigneeOmicron Electronics GmbH
InventorMarkus Pütter
Life of this patent
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Abstract
To ascertain a parameter of a transformer (40) that has a high voltage side (41) and a low voltage side (43), a test signal generated by a source (13) is impressed on the low voltage side (43). A test response of the transformer (40) is recorded. A leakage reactance and/or a leakage inductance of the transformer (40) is determined by an evaluation device (18) of an apparatus (10) on the basis of the test response of the transformer (40).
Claims15
1-15.
An apparatus for ascertaining a parameter of a transformer that has a high voltage side and a low voltage side, wherein the apparatus comprises:
- terminals for detachably connecting the apparatus to the low voltage side of the transformer,
- further terminals for detachably connecting the apparatus to the high voltage side of the transformer,
- a controllable switching device, connected to the further terminals, for shorting the high voltage side of the transformer,
- a source for generating a test signal, which source is connected to the terminals in order to impress the test signal on the low voltage side of the transformer, and
- an evaluation device that is set up to determine a leakage reactance or a leakage inductance of the transformer on the basis of a test response of the transformer.
A method for ascertaining a parameter of a transformer that has a high voltage side and a low voltage side, comprising
- shorting the high voltage side of the transformer using a controllable switching device,
- impressing a test signal on the low voltage side,
- recording a test response of the transformer, and
- determining a leakage reactance or a leakage inductance of the transformer on the basis of the test response of the transformer.
Dependencies are inferred from the claim text.