Probe card for a testing apparatus of electronic devices with enhanced filtering properties

A probe card for a testing apparatus of electronic devices comprises:

• a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test, and
• a space transformer comprising:
• first contact pads made on a first side of the space transformer;
• second contact pads made on a second side, opposite to the first side, of the space transformer;
• and
• conductive tracks or planes connecting at least some of the first contact pads to the second contact pads,
• the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
• a printed circuit board (PCB),
• a first plurality of filtering capacitors provided between the space transformer and the PCB,
• each filtering capacitor comprising a body and conductive portions arranged at sides of the body, the conductive portions electrically contacting the conductive tracks or planes,
• wherein the PCB comprises conductive tracks or planes that electrically contact the conductive portions of the filtering capacitors.

A probe card for a testing apparatus of electronic devices, comprises:

• a testing head housing a plurality of contact probes having respective contact tips configured to abut onto contact pads of a device under test, and
• a space transformer comprising:
• first contact pads made on a first side of the space transformer;
• second contact pads made on a second side, opposite to the first side, of the space transformer;
• and
• conductive tracks or planes connecting at least some of the first contact pads to the second contact pads,
• the space transformer realizing a spatial transformation of distances between the first contact pads and distances between the second contact pads,
• a printed circuit board (PCB),
• a plurality of electrical contact structures arranged between the space transformer and the PCB,
• a first plurality of filtering capacitors provided between the space transformer and the PCB,
• each filtering capacitor comprising a body and conductive portions arranged at sides of the body, the conductive portions electrically contacting the conductive tracks or planes,
• a conductive flexible interface realized between the filtering capacitors, the electrical contact structures and the PCB,
• wherein the conductive flexible interface electrically interconnects the space transformer and the PCB by pressure,
• a combination of the conductive tracks or planes, the conductive portions, and the conductive flexible interface transmitting routing a signal between the testing head and the PCB.