Contact probe and corresponding testing head

A testing head for functionality testing a device under test comprising a plurality of first contact probes, each first contact probe including:

• a probe body having a length of less than 5000 μm,
• a first end portion being a contact tip of the contact probe configured to abut onto a contact pad of a device under test,
• a second end portion being a contact head of the contact probe abutting onto a contact pad of a space transformer,
• the probe body extending in a longitudinal direction between the end portions and comprising a pass-through opening, extending along a longitudinal dimension of the probe body,
• wherein a filling material is positioned in the pass-through opening, the filling material defining first and second lateral portions in the probe body,
• the first and second lateral portions being parallel and joined to each other by a connecting central portion of the filling material at the pass-through opening, and
• the connecting central portion of the filling material acting as a strengthening element of the contact probe.

The testing head of 11, further comprising:

• a first auxiliary guide, arranged transversely to the probe bodies of the contact probes and comprising suitable guide holes wherethrough the contact probes slide, and
• a first gap defined by the first auxiliary guide,
• the first gap including one end of the pass-through opening, being a critical portion of the probe body of each contact probes and a zone more prone to breakings in the body,
• the critical portion being positioned in the first gap so that the critical portion undergoes low or even no bending stresses with respect to the rest of the probe body of each contact probe.

A contact probe of a testing head for a testing apparatus of electronic devices comprising:

• a probe body having a length of less than 5000 μm,
• a first end portion being a contact tip of the contact probe and configured to abut onto a contact pad of a device under test
• a second end portion being a contact head of the contact probe and configured to abut onto a contact pad of a space transformer, the probe body extending in a longitudinal direction between the end portions and comprising a pass-through opening, extending along its longitudinal dimension,
• a filling material positioned in the pass-through opening and defining first and second lateral portions in the probe body,
• the first and second lateral portions being parallel and joined to each other by a connecting central portion of the filling material at the pass-through opening
• the connecting central portion of the filling material acting as a strengthening element of the contact probe, and
• the filling material being also a coating layer that coats the body of the contact probe.

A contact probe of a testing head for a testing apparatus of electronic devices comprising:

• a probe body having a length of less than 5000 μm,
• a first end portion being a contact tip of the contact probe and configured to abut onto a contact pad of a device under test,
• a second end portion being a contact head of the contact probe and configured to abut onto a contact pad of a space transformer,
• the probe body extending in a longitudinal direction between the end portions and comprising a pass-through opening, extending along a longitudinal dimension of the probe body,
• wherein the pass-through opening is filled by a filling material defining first and second lateral portions in the probe body,
• the first and second lateral portions being parallel and joined to each other by a connecting central portion of the filling material at the pass-through opening,
• the connecting central portion of the filling material acting as a strengthening element of the contact probe,
• the filling material being also a coating layer that coats the body of the contact probe, and
• a material bridge arranged inside the pass-through opening and connecting the lateral portions to each other on sides of the pass-through opening.