Test systems with a probe apparatus and index mechanism

A probe card comprising:

• a wire guide having a beveled edge on a portion of a perimeter thereof;
• a probe tile connected with the wire guide,
• a plurality of probe wires supported by the wire guide and probe tile, each probe wire is positioned through the wire guide and the probe tile, each probe wire includes a probe tip extending through the probe tile, the probe tips forming an array to probe a device under test, each probe wire includes a signal transmitting portion and a guard portion exposed from the wire guide, the signal transmitting portions and the guard portions form a contact pattern and, with the array, are disposed on one side of the probe card;
• and
• a retainer member disposed on another side of the probe card.

A method of probing devices under test comprising:

• positioning a holder into a probe position, which includes retaining a probe card on a side of the holder;
• positioning, using the holder connected to a carriage mechanism, the probe card onto a circuit board and onto a device under test, the circuit board having a pattern of signal contacts and a pattern of guard contacts, the probe card including a plurality of probe wires, each probe wire includes a probe tip extending through the probe tile, the probe tips forming an array to probe the device under test, each probe wire includes a signal transmitting portion and a guard portion exposed from the wire guide, the signal transmitting portions and the guard portions form a contact pattern and, with the array, are disposed on a side of the probe card that is different from the side retained to the holder;
• indexing, using the carriage mechanism, the probe card to make aligned contact of the contact pattern of the probe card with the pattern of signal contacts and the pattern of guard contacts and to make contact of the array with the device under test;
• probing the device under test using the array;
• and
• transmitting signals through the array to a test equipment by way of contact of the probe card with the circuit board and of contact of the probe card with the device under test, which allows signals to be transferred through the probe wires and circuit board.