Apparatuses, systems and methods for testing electrical functions

An apparatus for testing electrical functions, comprising:

• at least one clamping tool configured to be capable of being clamped in the vicinity of at least one bonding area of an electronic device;
• at least one row of probes configured to be electrically connected to multiple pins in the at least one bonding area respectively when the at least one clamping tool is clamped in the vicinity of the at least one bonding area of the electronic device;
• and
• at least one multiplex switch, wherein each multiplex switch has a first terminal comprising multiple ports and connected to at least one group of probes in a row of probes via a group of wires respectively, and a second terminal comprising at least one port and capable of being connected to a measurement instrument via wires, and the at least one multiplex switch is configured to turn on or turn off an electrical connection between each of the multiple ports of the first terminal and at least one port of the second terminal.