Plasma spectroscopic analysis method and plasma spectroscopic analyzer
AssigneeARKRAY, Inc.
InventorTsuyoshi Takasu
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Abstract
A plasma spectroscopic analysis method includes a concentration process including a voltage application period in which voltage is applied to a pair of electrodes in the presence of a sample thereby concentrating an analyte contained in the sample in the vicinity of at least one of the pair of electrodes; and a detection process of generating a plasma by applying voltage to the pair of electrodes and detecting light emitted by the analyte due to the plasma. An electric current between the pair of electrodes is constant while applying voltage for at least a part of the duration of the concentration process.
Claims17
A plasma spectroscopic analysis method, comprising:
- a concentration process comprising a voltage application period in which voltage is applied to a pair of electrodes in the presence of a sample, thereby concentrating an analyte, contained in the sample, in the vicinity of at least one of the pair of electrodes:
- and
- a detection process of generating a plasma by applying voltage to the pair of electrodes and detecting light emitted by the analyte due to the plasma,
- wherein an electric current between the pair of electrodes is constant while applying voltage for at least a part of the duration of the concentration process.
Dependencies are inferred from the claim text.