Measurement probe and measuring device
AssigneeMitutoyo Corporation
InventorsHideyuki ARAI, Kazuya IWASAKI, Minoru TANAKA, Shuichi KAMIYAMA, Kazuhiko HIDAKA
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AssigneeMitutoyo Corporation
InventorsHideyuki ARAI, Kazuya IWASAKI, Minoru TANAKA, Shuichi KAMIYAMA, Kazuhiko HIDAKA
Estimating the term…
A probe includes a movable plate to which a stylus capable of contacting a measurable object is mounted, the movable plate displaceable in an X direction; a static plate arranged to overlap with the movable plate; a counter plate facing the movable plate and the static plate; an elastic movable side connection plate, the movable side connection plate connecting the counter plate at at least three places with each of a first end connector positioned toward a first end of the movable plate in the X direction and second end connectors positioned toward a second end in the X direction; and a static side connection plate which connects the static plate and the counter plate. An entire length of the first end connector in a Y direction orthogonal to the X direction is the same size as the entire length of the second end connectors in the Y direction.
A measurement probe performing measurement by contacting a measurable object, the measurement probe comprising:
A measuring device comprising:
Dependencies are inferred from the claim text.