Mask assembly for testing a deposition process, deposition apparatus including the mask assembly, and testing method for a deposition process using the mask assembly

A mask assembly comprising:

• a support member having a first opening configured to allow deposition materials to pass through, the support member being configured to support the base substrate on which a portion of the passed-through deposition materials are deposited;
• a shutter member accommodated in the support member, the shutter member having a second opening smaller than the first opening and configured to allow the portion of the passed-through deposition materials to pass through and deposit on the base substrate;
• and
• a drive member including a plurality of pinions,
• wherein a first pinion of the plurality of pinions contacts a side surface of the shutter member and a second pinion of the plurality of pinions is coupled to the first pinion and is configured to engage with transfer racks to change the position of the second opening with respect to the base substrate.