Ots for nvm array select lines
AssigneeHGST Netherlands B.V.
InventorsJames Edwin O'TOOLE, Ward PARKINSON, Daniel Robert SHEPARD, Thomas Michael TRENT
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AssigneeHGST Netherlands B.V.
InventorsJames Edwin O'TOOLE, Ward PARKINSON, Daniel Robert SHEPARD, Thomas Michael TRENT
Estimating the term…
The present disclosure generally relates to non-volatile memory arrays and memory devices in which a leakage current through an OTS is utilized to pre-charge a circuit of a memory chip. By running an additional wire on each side of a tile which is orthogonal to, above, or below the X and Y select wires, a high value resistance material, such as an OTS, may be deposited at the intersection. The OTS allows the word line or bit line to be selected without pulling excessive leakage to the select wire from the bias voltage, such as V/2. A thickness of the OTS is adjusted such that the Vt of the OTS is greater than V/2, with margin, and the OTS does not turn on when the OTS is selected. A resistance is created between the V/2 wire and the word line select wire or the bit line select wire.
A memory device, comprising:
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The memory device of claim 15, wherein the second memory element comprises a Resistive Random Access Memory (RRAM) material, and wherein the second select element comprises an ovonic threshold switch (OTS), a doped chalcogenide alloy, a thin film silicon, a metal-metal oxide switch, or a Field Assisted Superlinear Threshold selector (FAST).
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A memory device, comprising:
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A memory array, comprising:
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Dependencies are inferred from the claim text.