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AssigneeAltek Semiconductor Corp.
InventorsYu-Chih Wang, Shou-Te Wei, Yu-Wei Huang, Fu-Kui Yang, Chi-Ying Huang
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The disclosure provides a method and a system for multi-lens module alignment, adapted to perform alignment on a multi-lens module having at least a first lens and a second lens during its manufacturing stage, where the method includes the following steps. A calibration object is first captured by using the first lens and the second lens to accordingly generate intrinsic parameters and external parameters of the first lens and the second lens, where the external parameters of the first lens and the second lens are associated with a common reference coordinate system. A target object is next captured by using the first lens and the second lens, and captured images of the target object are processed by using the intrinsic parameters and the external parameters to generate rectified images. The first lens and the second lens are adjusted and aligned according to the rectified images.
A method for multi-lens module alignment, adapted to perform alignment on a multi-lens module comprising a first lens and a second lens during manufacture, wherein the method comprises the following steps:
A system for multi-lens module alignment, adapted to perform alignment on a multi-lens module comprising a first lens and a second lens during manufacture, wherein the system comprises:
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