Processing method, processing apparatus and processing program

A processing apparatus that determines conditions of pole figure measurement by X-ray diffraction, comprising:

• an input unit configured to receive input of a diffraction angle 2θ;
• a condition determination unit configured to determine an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each φ scan for a rotation angle φ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the input angle 2θ;
• and
• a processing control unit configured to repeat determining the angle ω and the angle χ.

A non-transitory computer readable recording medium having recorded thereon a processing program for determining conditions of pole figure measurement by X-ray diffraction, the processing program causing a computer to execute the processes of:

• receiving input of a diffraction angle 2θ;
• and
• determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each φ scan for a rotation angle φ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the input angle 2θ,
• wherein determining the angle ω and the angle χ is repeated.