Diagnostic system for a dc-dc voltage converter

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a low voltage bi-directional MOSFET switch, the low voltage bi-directional MOSFET switch having a first node and a second node, a first voltage being output at the first node, a second voltage being input to the second node, comprising:

• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including first and second common channels and at least first and second non-common channels, the second bank of channels including the first and second common channels and at least third and fourth non-common channels;
• the first common channel being electrically coupled to the first node of the low voltage bi-directional MOSFET switch for receiving the first voltage;
• the microcontroller being programmed to sample the first voltage at a first sampling rate utilizing the first common channel in the first bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to determine a first number of voltage samples in the first predetermined number of voltage samples in which the first voltage is greater than a first threshold voltage;
• the microcontroller being further programmed to set a first voltage diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating a voltage out of range high fault condition for the analog-to-digital converter;
• the microcontroller being further programmed to sample the first voltage at a first sampling rate utilizing the first common channel in the second bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to determine a second number of voltage samples in the second predetermined number of voltage samples in which the first voltage is greater than the first threshold voltage;
• and
• the microcontroller being further programmed to set a second voltage diagnostic flag equal to a second first fault value if the second number of voltage samples is greater than the first threshold number of voltage samples indicating the voltage out of range high fault condition for the analog-to-digital converter.

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a low voltage bi-directional MOSFET switch, the low voltage bi-directional MOSFET switch having a first node and a second node, a first voltage being output at the first node, a second voltage being input to the second node, comprising:

• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including first and second common channels and at least first and second non-common channels, the second bank of channels including the first and second common channels and at least third and fourth non-common channels;
• the first common channel being electrically coupled to the first node of the low voltage bi-directional MOSFET switch for receiving the first voltage;
• the first non-common channel of the first bank of channels being electrically coupled to the second node of the low voltage bi-directional MOSFET switch for receiving the second voltage;
• the microcontroller being programmed to sample the first voltage at a first sampling rate utilizing the first common channel in the first bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a first average voltage value corresponding to an average value of the first predetermined number of voltage samples;
• the microcontroller being further programmed to sample the second voltage at the first sampling rate utilizing the first non-common channel in the first bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a second average voltage value corresponding to an average value of the second predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a first voltage difference value corresponding to an absolute value of a difference between the first average voltage value and the second average voltage value;
• and
• the microcontroller being further programmed to stop generating a control signal to induce a high voltage bi-directional MOSFET switch to transition to an open operational state if the first voltage difference value is greater than a first threshold voltage difference value.

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a low voltage bi-directional MOSFET switch, the low voltage bi-directional MOSFET switch having a first node and a second node, a first voltage being output at the first node, a second voltage being input to the second node, comprising:

• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including first and second common channels and at least first and second non-common channels, the second bank of channels including the first and second common channels and at least third and fourth non-common channels;
• the first common channel being electrically coupled to the first node of the low voltage bi-directional MOSFET switch for receiving the first voltage;
• the first non-common channel of the first bank of channels being electrically coupled to the second node of the low voltage bi-directional MOSFET switch for receiving the second voltage;
• the microcontroller being programmed to sample the first voltage at a first sampling rate utilizing the first common channel in the second bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a first average voltage value corresponding to an average value of the first predetermined number of voltage samples;
• the microcontroller being further programmed to sample the second voltage at the first sampling rate utilizing the first non-common channel in the first bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a second average voltage value corresponding to an average value of the second predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a first voltage difference value corresponding to an absolute value of a difference between the first average voltage value and the second average voltage value;
• and
• the microcontroller being further programmed to stop generating a control signal to induce a high voltage bi-directional MOSFET switch to transition to an open operational state if the first voltage difference value is greater than a first threshold voltage difference value.

A diagnostic system for a DC-DC voltage converter, the DC-DC voltage converter having a low voltage bi-directional MOSFET switch, the low voltage bi-directional MOSFET switch having a first node and a second node, a first voltage being output at the first node, a second voltage being input to the second node, comprising:

• a microcontroller having an analog-to-digital converter, the analog-to-digital converter having a first bank of channels and a second bank of channels;
• the first bank of channels including first and second common channels and at least first and second non-common channels, the second bank of channels including the first and second common channels and at least third and fourth non-common channels;
• the first common channel being electrically coupled to the first node of the low voltage bi-directional MOSFET switch for receiving the first voltage;
• the first non-common channel of the first bank of channels being electrically coupled to the second node of the low voltage bi-directional MOSFET switch for receiving the second voltage;
• the microcontroller being programmed to sample the first voltage at a first sampling rate utilizing the second common channel in the first bank of channels to obtain a first predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a first average voltage value corresponding to an average value of the first predetermined number of voltage samples;
• the microcontroller being further programmed to sample the second voltage at the first sampling rate utilizing the first non-common channel in the first bank of channels to obtain a second predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a second average voltage value corresponding to an average value of the second predetermined number of voltage samples;
• the microcontroller being further programmed to calculate a first voltage difference value corresponding to an absolute value of a difference between the first average voltage value and the second average voltage value;
• and
• the microcontroller being further programmed to stop generating a control signal to induce a high voltage bi-directional MOSFET switch to transition to an open operational state if the first voltage difference value is greater than a first threshold voltage difference value.