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US 2017/0365678 A1Published application
Method of forming a semiconductor device and structure therefor
AssigneeSemiconductor Components Industries, LLC
InventorGordon M. GRIVNA
Life of this patent
Estimating the term…
Abstract
An embodiment of a semiconductor device includes forming an active region that extends vertically into the semiconductor material in which the semiconductor device is formed. The active region may include a P-N junction or alternately a gate or a channel region of an MOS transistor.
Claims20
A semiconductor device comprising:
- a semiconductor substrate of a first conductivity type;
- a semiconductor region of the first conductivity type overlying the semiconductor substrate, the semiconductor region having a major surface;
- a first opening formed to extend from the major surface of the semiconductor region a first distance into the semiconductor region;
- a first material within the first opening;
- a semiconductor junction along a sidewall of the first opening, the semiconductor junction formed between the first material and the semiconductor region;
- a second opening in the semiconductor region, the second opening extending substantially the first distance from the major surface into the semiconductor region;
- and
- a first semiconductor material within the second opening, the first semiconductor material having the first conductivity type and a doping concentration that is greater than a doping concentration of the semiconductor region.
5 more elements
A method of forming a semiconductor device comprising:
- providing a semiconductor substrate;
- forming a semiconductor region of a first conductivity type on a surface of the semiconductor substrate, the semiconductor region having a major surface;
- forming a first opening extending from the major surface a first distance into the semiconductor region;
- forming a second opening extending from the major surface substantially the first distance into the semiconductor region;
- forming a first semiconductor material in the first opening, the first semiconductor material having a second conductivity type that is opposite to the conductivity type of the first conductivity type, the first semiconductor material forming a first P-N junction with the semiconductor region, the first semiconductor material forming one of a drain of a transistor or an anode of a diode;
- and
- forming a doped semiconductor region in the second opening, the doped semiconductor region having the second conductivity type, the doped semiconductor region forming a second P-N junction with an adjacent semiconductor material, the doped semiconductor region forming one of a source of the transistor or a cathode of the diode.
4 more elements
A method of forming a semiconductor device comprising:
- forming a first semiconductor region of a first conductivity type overlying semiconductor substrate;
- forming one or more openings extending from a major surface of the first semiconductor region a distance into the first semiconductor region;
- forming a first current carrying electrode of the semiconductor device in a first portion of the one of more openings;
- and
- forming a second current carrying electrode of the semiconductor device in a second portion of the one of more openings wherein a first portion of the first semiconductor region is disposed between the first and second current carrying electrodes and separates the first and second current carrying electrodes from each other.
2 more elements
Dependencies are inferred from the claim text.