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US 2017/0365666 A1Published application
Nitride semiconductor epitaxial wafer and field effect nitride transistor
AssigneeSumitomo Chemical Company, Limited
InventorsTakeshi TANAKA, Naoki KANEDA, Yoshinobu NARITA
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Abstract
A nitride semiconductor epitaxial wafer includes a substrate, a GaN layer provided over the substrate, and an AlGaN layer provided over the GaN layer. The GaN layer has a wurtzite crystal structure, and a ratio c/a of a lattice constant c in a c-axis orientation of the GaN layer to a lattice constant a in an a-axis orientation of the GaN layer is not more than 1.6266.
Claims10
A nitride semiconductor epitaxial wafer, comprising:
- a substrate;
- a GaN layer configured to be an electron transit layer provided over the substrate;
- an AlGaN layer configured to be an electron feed layer provided over the GaN layer;
- wherein the GaN layer comprises a wurtzite crystal structure, and a measured ratio c/a of the lattice constant c in a c-axis orientation of the GaN layer to a lattice constant a in the a-axis orientation of the GaN layer is not more than 1.6266 despite the application of lattice mismatch stresses at interfaces between the GaN layer and the substrate and the AlGaN layer, and
- wherein the measured ratio c/a allows the occurrence of only negative charges on the surface of the GaN layer on which a two-dimensional electron gas is induced spatially due to the lattice mismatch stresses to suppress current collapse.
2 more elements
A field effect nitride transistor, comprising:
- a substrate;
- a GaN layer configured to be an electron transit layer provided over the substrate;
- an AlGaN layer configured to be an electron feed layer provided over the GaN layer;
- a source electrode and a drain electrode provided directly or via an intermediate layer on the AlGaN layer, and
- a gate electrode provided between the source electrode and the drain electrode,
- wherein the GaN layer comprises a wurtzite crystal structure, and a measured ratio c/a of the lattice constant c in a c-axis orientation of the GaN layer to a lattice constant a in the a-axis orientation of the GaN layer is not more than 1.6266 despite the application of lattice mismatch stresses at interfaces between the GaN layer and the substrate and the AlGaN layer, and
- wherein the measured ratio c/a allows the occurrence of only negative charges on the surface of the GaN layer on which a two-dimensional electron gas is induced spatially due to the lattice mismatch stresses to suppress current collapse.
4 more elements
Dependencies are inferred from the claim text.