Nano Wire Structure and Method for Fabricating the Same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChing-Feng Fu, De-Fang Chen, Yu-Chan Yen, Chia-Ying Lee, Chun-Hung Lee, Huan-Just Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChing-Feng Fu, De-Fang Chen, Yu-Chan Yen, Chia-Ying Lee, Chun-Hung Lee, Huan-Just Lin
Estimating the term…
A method includes depositing a sacrificial layer on a first dielectric layer over a substrate; applying a first patterning process, a second patterning process, a third patterning process to the sacrificial layer to form a first group of openings, a second group of openings and a third group of openings, respectively, in the sacrificial layer, wherein three first openings from three different patterning processes form a first side, a second side and a first angle between the first side and the second side, and three second openings from the three different patterning processes form a third side, a fourth side and a second angle between the third side and the fourth side, wherein the first angle is approximately equal to the second angle and forming nanowires based on the first group of openings, the second group of openings and the third group of openings.
A method comprising:
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