Method of manufacturing semiconductor device, and semiconductor manufacturing apparatus
AssigneeTokyo Electron Limited
InventorMitsuhiro OKADA
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorMitsuhiro OKADA
Estimating the term…
There is provided a method of manufacturing a semiconductor device, which includes: forming a silicon film inside a recess formed in a surface of a workpiece by supplying a film forming gas containing silicon to the workpiece; subsequently, supplying a process gas, which includes a halogen gas for etching the silicon film and a roughness suppressing gas for suppressing roughening of a surface of the silicon film after being etched by the halogen gas, to the workpiece; etching the silicon film formed on a side wall of the recess to enlarge an opening width of the recess by applying thermal energy to the process gas and activating the process gas; and subsequently, filling silicon into the recess by supplying the film forming gas to the workpiece and depositing silicon on the silicon film remaining in the recess.
A method of manufacturing a semiconductor device, comprising:
A semiconductor manufacturing apparatus, comprising:
Dependencies are inferred from the claim text.