US 2017/0363682 A1 · TESTING SYSTEM, METHOD FOR TESTING AN INTEGRATED CIRCUIT AND A CIRCUIT BOARD INCLUDING THE SAME

Abstract

A testing system includes a subtractor and a divider. The subtractor is configured to receive a first voltage of a circuit being tested and a second voltage of the circuit, and to derive a difference between the first voltage and the second voltage. The divider is configured to receive the difference between the first voltage and the second voltage, and to derive a resistance of the circuit by dividing (i) the difference between the first voltage and the second voltage by (ii) a difference between a first current applied to the circuit and a second current applied to the circuit. The first voltage is corresponding to the first current, and the second voltage is corresponding to the second current.

Claims20

Dependent claims

A testing system, comprising:

a subtractor configured to receive a first voltage of a circuit being tested and a second voltage of the circuit, and to derive a difference between the first voltage and the second voltage;
and
a divider configured to receive the difference between the first voltage and the second voltage, and to derive a resistance of the circuit by dividing (i) the difference between the first voltage and the second voltage by (ii) a difference between a first current applied to the circuit and a second current applied to the circuit,
wherein the first voltage is corresponding to the first current, and the second voltage is corresponding to the second current.

1 more element

Dependencies are inferred from the claim text.

Facts

Application

15/183,253Filed 15 Jun 2016

Published

21 Dec 2017

Term ends

Not estimatedThe source records don’t support an estimate.

Classification5 codes

G01R 31/2896
Testing of integrated circuits [IC]: testing of IC packages; Test features related to IC packages
G01R 31/70
Testing of connections, e.g. of plugs or non-disconnectable joints: testing of connections between components and printed circuit boards
G01R 31/2853
Testing of integrated circuits [IC]: electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
G01R 31/31715
Input or output aspects: testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of…

Testing system, method for testing an integrated circuit and a circuit board including the same

Life of this patent

Testing system, method for testing an integrated circuit and a circuit board including the same

Life of this patent

Abstract

Claims20