Interference measuring device and method of measurement using the same device
AssigneeMitutoyo Corporation
InventorsTatsuya Nagahama, Ken Motohashi, Han Haitjema, Johannes Anna Quaedackers
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AssigneeMitutoyo Corporation
InventorsTatsuya Nagahama, Ken Motohashi, Han Haitjema, Johannes Anna Quaedackers
Estimating the term…
The present invention provides an interference measuring device with an optical system that can receive light reflected from a measurement object of a surface profile that is not perpendicular to an optical axis. An interference measuring device includes a light source for emitting light and an interferometric objective lens. The interferometric objective lens includes a reference mirror disposed in a reference beam path and a beam splitter that splits the incident light into a beam traveling along the reference beam path and a beam traveling along a measurement beam path. The beam splitter also combines the beam reflected off the reference mirror with the beam reflected off a measurement object disposed in the measurement beam path before emitting the combined beams. The interference measuring device further includes an imaging unit for taking an image of the combined beams forming on the unit and an aperture stop disposed in an optical path linking the interferometric objective lens, the light source, and the imaging unit together. The aperture stop is movable along an optical axis of the interferometric objective lens.
An interference measuring device comprising:
A method of measurement by optical interference, the method using an interference measuring device comprising:
Dependencies are inferred from the claim text.