Contact-type position measuring device and measuring method using the same
AssigneeDmg Mori Co., Ltd.
InventorKoji SATO
Life of this patent
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Abstract
A contact-type position measuring device is configured by a straight hole diameter measuring probe measuring a diameter of straight hole by moving in a radius direction and contacting to an internal peripheral surface of a straight hole, which extends to an axis direction; and a chamfered hole diameter measuring probe measuring a diameter of chamfered hole by moving in the axis direction and contacting to an internal peripheral surface of a chamfered hole.
Claims3
A contact-type position measuring device comprising:
- a straight hole diameter measuring probe measuring a diameter of a straight hole by moving in a radius direction and contacting to an internal peripheral surface of the straight hole which extends in an axis direction;
- and
- a chamfered hole diameter measuring probe measuring a diameter of a chamfered hole by moving in the axis direction and contacting to an internal peripheral surface of the chamfered hole.
A measuring method of a chamfered hole diameter using a contact-type position measuring device, the method comprising the steps of:
- measuring a diameter of a straight hole by a straight hole diameter measuring probe, and computing a center of the straight hole by the measured diameter of the straight hole;
- moving a chamfered hole diameter measuring probe to be aligned with the computed center of the straight hole;
- and
- measuring the chamfered hole diameter by moving the chamfered hole diameter measuring probe in a straight hole direction.
Dependencies are inferred from the claim text.