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US 2017/0323439 A1Published application
System And Method For Functional Reconstruction Of Integrated Circuits From Layout Analysis Of Circuit Images
AssigneeRoccor, LLC
InventorsHans Kristian Sandberg, Dixon Chen Dick, Gary L. Duerksen
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Abstract
A method for reverse engineering the layout structure of an integrated circuit includes providing an image of a layer of the integrated circuit; processing the image to identify differentiated regions; associating the differentiated regions; and deriving a functional relationship between the association of the differentiated regions.
Claims20
A method of identifying layout-functional relationships of an integrated circuit comprising:
- providing a first image of at least a portion of a first layer of the integrated circuit;
- processing the first image to identify at least two differentiated regions;
- associating the differentiated regions;
- and
- inferring at least one layout-functional relationship between the associated differentiated regions.
2 more elements
A system for reverse engineering an integrated circuit comprising:
- an imaging system configured to collect an image of the integrated circuit;
- and
- a processor configured to (a) identify at least two differentiated regions of the image, (b) associate the differentiated regions, and (c) infer at least one layout-functional relationship between the associated differentiated regions.
A method for determining provenance of an integrated circuit comprising:
- providing an image of at least a portion of a layer of the integrated circuit;
- processing the image to identify at least two differentiated regions;
- extracting at least one of foundry, design rule and functional information from analysis of associations of the differentiated regions;
- and
- comparing the extracted information with a predetermined set of references.
2 more elements
Dependencies are inferred from the claim text.