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AssigneeFreescale Semiconductor, Inc.
InventorsChad Dawson, Keith Kraver, Shiraz Contractor
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A pressure sensor device and a method for testing the pressure sensor device is provided. The pressure sensor device includes a first pressure sensor cell having a first capacitance value, and a second pressure sensor cell having a second capacitance value, the second capacitance value being different from the first capacitance value. In one embodiment, the method includes determining a temperature coefficient offset to test for faults in the pressure sensor device. In another embodiment, the method includes determining a differential mode calculation and a common mode calculation. A fault exists if the differential and common mode calculations do not agree.
A method for testing a pressure sensor device comprising a first pressure sensor and a second pressure sensor, the first and second pressure sensors being mismatched with respect to each other, the method comprising:
A method for testing a pressure sensor device comprising a first pressure sensor and a second pressure sensor, the first and second pressure sensors being mismatched with respect to each other, the method comprising:
A pressure sensor device, comprising:
Dependencies are inferred from the claim text.