Method for detecting defective pixels

A method for detecting defective pixels included in an image-processing procedure comprising a pixel-processing procedure, the pixel-processing procedure being applied to pixels of at least one image issuing from an image sensor, each pixel corresponding to an active element of the image sensor, referred to as a photosite, able to convert an incident light beam into an electrical signal, each pixel being associated with a classification value representing a state of said pixel, wherein the method comprises:

• applying a combined pixel-processing and defective-pixel detection procedure to each pixel of an image, comprising, for each pixel,
• applying the pixel-processing procedure to said pixel, the pixel-processing procedure supplying, when it is applied to pixels of said image, pixels of said image issuing from filterings intended to attenuate an acquisition noise and/or to improve and/or detect contours in said image and/or information representing an object detected and followed in said image;
• analysing a result supplied by the pixel-processing procedure;
• in the event of obtaining an unusual result representing a defect on a photosite of the image sensor that supplied said pixel, incrementing a variable representing a number of detections of an unusual result for said pixel;
• and
• associating said pixel with a classification value representing a defective pixel when said variable reaches a first threshold representing a maximum number of unusual results.