Systems and methods for testing electronic devices using master-slave test architectures

A system comprising:

• a master test system configured to provide:
• first test instructions to test a first plurality of devices under test, the first plurality of devices under test being housed in a first plurality of test slots, the first plurality of test slots being configured to protect the first plurality of devices under test from first electromagnetic interference associated with the first plurality of devices under test;
• and
• second test instructions to test a second plurality of devices under test, the second plurality of devices under test being housed in a second plurality of test slots, the second plurality of test slots being configured to protect the second plurality of devices under test from second electromagnetic interference associated with the second plurality of devices under test;
• a first device interface configured to couple the master test system to the first plurality of devices under test over a first coupling, the first device interface being configured to accommodate first signal degradation due to the first coupling;
• a first slave test system coupled to the master test system, the first slave test system configured to provide the second test instructions to the second plurality of devices under test;
• and
• a second device interface configured to couple the first slave test system to the second plurality of devices under test over a second coupling, the second device interface being configured to accommodate second signal degradation due to the second coupling.