Composite oxide semiconductor and method for manufacturing the same
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsShunpei YAMAZAKI, Yasutaka NAKAZAWA, Masashi OOTA
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsShunpei YAMAZAKI, Yasutaka NAKAZAWA, Masashi OOTA
Estimating the term…
The field-effect mobility and reliability of a transistor including an oxide semiconductor film are improved. A semiconductor layer of a transistor is formed using a composite oxide semiconductor in which a first region and a second region are mixed. The first region includes a plurality of first clusters containing one or more of indium, zinc, and oxygen as a main component. The second region includes a plurality of second clusters containing one or more of indium, an element M (M represents Al, Ga, Y, or Sn), zinc, and oxygen. The first region includes a portion in which the plurality of first clusters are connected to each other. The second region includes a portion in which the plurality of second clusters are connected to each other.
A composite oxide semiconductor comprising:
A method for manufacturing a composite oxide semiconductor, comprising:
A method for manufacturing a composite oxide semiconductor, comprising:
Dependencies are inferred from the claim text.