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US 2017/0288016 A1Published application
Finfet with isolated source and drain
AssigneeGlobalfoundries Inc.
InventorsHoong Shing WONG, Min-hwa CHI, Tae-Hoon KIM
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Abstract
A FinFET has shaped epitaxial structures for the source and drain that are electrically isolated from the substrate. Shaped epitaxial structures in the active region are separated from the substrate in the source and drain regions while those in the channel region remain. The gaps created by the separation in the source and drain are filled with electrically insulating material. Prior to filling the gaps, defects created by the separation may be reduced.
Claims17
A method, comprising:
- providing a semiconductor structure, the structure comprising:
- a semiconductor substrate;
- at least one semiconductor fin coupled to the semiconductor substrate and surrounded at a bottom portion thereof by a dielectric layer, and an active region having a source region, a drain region and a channel region therebetween, the active region comprising a layer of epitaxy surrounding a top portion of the at least one semiconductor fin, a dummy gate encompassing the channel region and a spacer on either side of the dummy gate;
- physically separating the top portion of the at least one semiconductor fin from the bottom portion of the at least one semiconductor fin in the source region and the drain region, the physically separating forming gaps;
- and
- after the physically separating, forming a continuous dielectric layer in the gaps and around the layer of epitaxy in the source region and the drain region.
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Dependencies are inferred from the claim text.