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US 2017/0288013 A1Published application
Semiconductor device and method of manufacturing the same
AssigneeRenesas Electronics Corporation
InventorShigeo TOKUMITSU
Life of this patent
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Abstract
A semiconductor device includes a high voltage transistor formation region defined by an element isolation insulating film, a transistor formation region defined by an element isolation insulating film, and a substrate contact portion. A crystal defect region is formed at a portion of a semiconductor substrate that is positioned immediately below each of the substrate contact portion and element isolation insulating films.
Claims12
A semiconductor device comprising:
- a semiconductor substrate having a main surface;
- a first element formation region defined by a first insulating isolation portion reaching from said main surface to a first depth;
- a first semiconductor element formed in said first element formation region;
- a second element formation region disposed at a distance from said first element formation region and defined by a second insulating isolation portion reaching from said main surface to said first depth;
- a second semiconductor element formed in said second element formation region;
- a substrate contact portion formed in a region of said semiconductor substrate that is positioned between said first element formation region and said second element formation region, said substrate contact portion including a portion reaching from said main surface to a second depth;
- and
- a crystal defect region including a first crystal defect region formed at a portion of said semiconductor substrate that is positioned immediately below said substrate contact portion.
5 more elements
A method of manufacturing a semiconductor device, comprising the steps of:
- forming a first isolation groove defining a -first element formation region and a second isolation groove defining a second element formation region to reach from a main surface of a semiconductor substrate to a first depth, and forming an opening reaching from said main surface of said semiconductor substrate positioned between said first isolation groove and said second isolation groove to said first depth;
- forming a first semiconductor element in said first element formation region;
- forming a second semiconductor element in said second element formation region;
- forming an insulating film so as to fill said first isolation groove, said second isolation groove, and said opening to form a first insulating isolation portion in said first isolation groove and form a second insulating isolation portion in said second isolation groove;
- successively performing processing on a portion of said insulating film buried in said opening and on said semiconductor substrate to form a contact opening passing through said insulating film to reach said first depth;
- forming a conductor in said contact opening to form a substrate contact portion;
- and
- injecting an injection seed not concerned with a conductivity type to form a crystal defect region in said semiconductor substrate,
- the step of forming said crystal defect region including the step of forming a first crystal defect region at a portion of said semiconductor substrate that is positioned immediately below said substrate contact portion.
6 more elements
Dependencies are inferred from the claim text.