Solid-state imaging device and electronic apparatus

Abstract

The present disclosure relates to a solid-state imaging device that is designed to reduce reflection of incident light at the sidewall surface of the light blocking layer of each phase difference detection pixel, and to an electronic apparatus. A solid-state imaging device according to one aspect of the present disclosure includes: a normal pixel for generating a pixel signal; and a phase difference detection pixel for generating a phase difference signal for image plane phase difference AF. In this solid-state imaging device, the normal pixel and the phase difference detection pixel each include a photoelectric conversion layer and a lens for gathering incident light onto the photoelectric conversion layer, the phase difference detection pixel includes a light blocking layer having an apertural portion with an aperture deviating from the optical axis of the lens, and an antireflection portion that prevents reflection of the incident light gathered by the lens unit is formed on the light blocking layer. The present disclosure can be applied to back-illuminated CISs.

Dependencies are inferred from the claim text.