Method for manufacturing semiconductor device
AssigneeRenesas Electronics Corporation
InventorYukinori TASHIRO
Life of this patent
Estimating the term…
Loading patent…
AssigneeRenesas Electronics Corporation
InventorYukinori TASHIRO
Estimating the term…
The reliability of a semiconductor device is improved. During resin injection in a molding step, in a plan view, a plurality of gates of a molding die are arranged at positions different from those over extended lines of a plurality of dicing regions and a resin is injected from the gates. In this way, it becomes possible to reduce entrainment of air in the dicing regions and to lower an occurrence rate of voids. As a consequence, it becomes possible to suppress an occurrence of poor appearance such as formation of voids in a sealing body and to suppress formation of a starting point of a crack which may occur during a reflow process. Thus, the reliability of the semiconductor device can be improved.
A method for manufacturing a semiconductor device, comprising the steps of:
A method for manufacturing a semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.