System and method for analyzing features of a human face using one or more overlay facial grids
OwnerAndrew John-Haidukewych Haydukeinventor
Life of this patent
Estimating the term…
Loading patent…
OwnerAndrew John-Haidukewych Haydukeinventor
Estimating the term…
The present invention generally relates to human facial feature analysis. Specifically, embodiments of the present invention relate a system and method for utilizing one or more overlay grids in conjunction with imagery of a human face in order to analyze beauty and attractiveness of the face in the underlying imagery. In a preferred embodiment, the system utilizes computerized image capture features and processing features to analyze a human face in relation to a plurality of overlay grids in order to identify and empirically measure beauty and attractiveness based on the alignment of said overlay grids with specific features (e.g., nose, lips, eyebrows) of the human face and whether a successful fit exists with specifically defined Hayduke facial grids or by how close the individual's facial features align with specifically defined Hayduke facial grids.
A system for analyzing the attractiveness of a human face, the system comprising:
A method for analyzing the attractiveness of a human face, and wherein the method comprises the steps of:
Dependencies are inferred from the claim text.