Semiconductor device

A semiconductor device comprising:

• a first circuit including a plurality of logic circuits each connected to an identical voltage wire;
• a plurality of pattern generators respectively corresponding to the plurality of logic circuits, and each supplying a test pattern to the corresponding logic circuit;
• a processing unit supplied with a signal output from each of the plurality of logic circuits in response to the test pattern;
• and
• a control circuit connected to the plurality of pattern generators, and controlling such that stop timings of the test patterns supplied to the corresponding logic circuits differ from one another among the plurality of pattern generators.

A semiconductor device comprising:

• a first circuit including a plurality of logic circuits each connected to an identical voltage wire;
• a plurality of pattern generators respectively corresponding to the plurality of logic circuits, and each supplying a test pattern to the corresponding logic circuit;
• a processing circuit supplied with a signal output from each of the plurality of logic circuits in response to the test pattern;
• and
• a control circuit connected to the plurality of pattern generators, and controlling the plurality of pattern generators such that start timings of supply of the test patterns to the corresponding logic circuits differ from one another among the plurality of pattern generators.