Ic test site vision alignment system

A method for visually aligning an integrated circuit device in a test handler system, comprising:

• moving an integrated circuit device using a transfer mechanism from an input side of the test handler system to a test side of the test handler system, the transfer mechanism comprising a first alignment device;
• moving the integrated circuit device from the transfer mechanism to a contactor array using a pick-and-place device, the test pick-and-place device comprising a first engagement mechanism;
• imaging the integrated circuit device on the pick-and-place device;
• calculating a position of the integrated circuit device relative to a local coordinate system;
• testing the integrated circuit device using the contactor array, the contactor array comprising a second alignment device and the tested integrated circuit device having a plurality of test markings;
• imaging the tested integrated circuit device at an output side of the test handler system;
• calculating a position of the contactor array relative to the local coordinate system based on positions of the plurality of test markings and the relative position of the integrated circuit device;
• determining an offset between the calculated position of the integrated circuit device and the calculated position of the contactor array relative to the local coordinate system;
• and
• correcting a position of the integrated circuit device placed on the transfer mechanism based on the determined offset using a correction mechanism.