Systems and Methods for Testing Electrical Leakage
AssigneeDisruptive Technologies Research AS
InventorBjornar Hernes
Life of this patent
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Abstract
A method of testing a self-contained device under test having at least a circuit under test and a power source is provided. The method may include at least temporarily enabling power from the power source to the circuit under test, determining a first voltage across the circuit under test, determining a second voltage across the circuit under test after a test duration, and calculating an average current of the circuit under test based at least partially on the first voltage, the second voltage and the test duration.
Claims20
A method of testing a self-contained device under test having at least a circuit under test and a power source, comprising:
- at least temporarily enabling power from the power source to the circuit under test;
- determining a first voltage across the circuit under test;
- determining a second voltage across the circuit under test after a test duration;
- and
- calculating an average current of the circuit under test based at least partially on the first voltage, the second voltage and the test duration.
A device under test, comprising:
- a power source;
- a circuit under test;
- and
- a testing device in communication with each of the power source and the circuit under test, the testing device configured to at least temporarily enable power from the power source to the circuit under test, determine a first voltage across the circuit under test, determine a second voltage across the circuit under test after a test duration, and calculate an average current of the circuit under test based at least partially on the first voltage, the second voltage and the test duration.
A device for testing a circuit under test, comprising:
- a timer module configured to define a test duration;
- a measurement module configured to measure at least a voltage across the circuit under test;
- a switch module configured to selectively couple a power source to the circuit under test;
- and
- a sequencing module in communication with each of the timer module, the measurement module and the switching module, the sequencing module being configured to at least temporarily enable power from the power source to the circuit under test, measure a first voltage, measure a second voltage after the test duration, and calculate an average current of the circuit under test based at least partially on the first voltage, the second voltage and the test duration.
Dependencies are inferred from the claim text.