Rejection of mechanical vibration induced noise in electrical measurements

A processor-controlled method, comprising:

• determining a frequency at which a cooling mechanism of an electronic test instrument should operate;
• causing the cooling mechanism to operate at the determined frequency;
• selecting a signal filter based on the determined frequency;
• and
• applying the signal filter to an electrical signal being measured by the electronic test instrument to reduce effects on the electrical signal resulting from mechanical vibrations of the cooling mechanism.

An electronic test measurement system, comprising:

• a device under test (DUT);
• and
• an electronic test instrument that includes:
• a signal input configured to receive an electrical signal from the DUT;
• a cooling mechanism;
• and
• a processor configured to:
• determine a frequency at which the cooling mechanism should operate;
• cause the cooling mechanism to operate at the determined frequency;
• select a filter based on the determined frequency;
• and apply the filter to the electrical signal to reduce interference with the electrical signal resulting from mechanical vibrations of the cooling mechanism.