Image measurement system and controller

An image measurement system comprising:

• a controller;
• a projector for emitting illumination light in accordance with a radiation pattern specified from the controller;
• an imaging unit having a field of view in which an area irradiated with the illumination light exists;
• and
• a display unit adapted to display an image,
• the controller configured to
• extract an area including a pixel exceeding a predetermined luminance in an image of the field of view captured by the imaging unit in a state in which the illumination light is emitted,
• determine a mask area based on the extracted area, the mask area being an area in which the quantity of illumination light is to be reduced compared with another area in the field of view, and
• update the radiation pattern in accordance with the determined mask area, based on a correspondence in position between the radiation pattern of the projector and a projection pattern produced in the field of view by the radiation pattern.

A controller for use in an image measurement system including a projector for emitting illumination light and an imaging unit having a field of view in which an area irradiated with the illumination light exists, the controller configured to:

• instruct the projector to emit illumination light in accordance with a radiation pattern;
• display on the display unit an image of the field of view captured by the imaging unit in a state in which the illumination light is emitted;
• receive a setting of a mask area in association with the image displayed on the display unit, the mask area being an area in which the quantity of illumination light is to be reduced compared with another area in the field of view;
• and
• update the radiation pattern in accordance with the set mask area, based on a correspondence in position between the radiation pattern of the projector and a projection pattern produced in the field of view by the radiation pattern.