Memory device
AssigneeKabushiki Kaisha Toshiba
InventorsKikuko SUGIMAE, Yusuke ARAYASHIKI
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AssigneeKabushiki Kaisha Toshiba
InventorsKikuko SUGIMAE, Yusuke ARAYASHIKI
Estimating the term…
A memory device according to an embodiment includes a first interconnect, a second interconnect, a first variable resistance member, a third interconnect, a second variable resistance member, a fourth interconnect, a fifth interconnect and a third variable resistance member. The first interconnect, the third interconnect and the fourth interconnect extend in a first direction. The second interconnect and the fifth interconnect extend in a second direction crossing the first direction. The first variable resistance member is connected between the first interconnect and the second interconnect. The second variable resistance member is connected between the second interconnect and the third interconnect. The third variable resistance member is connected between the fourth interconnect and the fifth interconnect. The fourth interconnect is insulated from the third interconnect.
A memory device, comprising:
-13. (canceled)
A memory device, comprising:
(canceled)
A memory device, comprising:
The device according to 20, wherein each of the first variable resistance member and second variable resistance member includes a layer including a Tellurium.
The device according to 20, wherein a variable resistance member is not provided between the second interconnection and the third interconnection.
Dependencies are inferred from the claim text.