Measurement apparatus and measurement method
AssigneeOki Electric Industry Co., Ltd.
InventorKengo KOIZUMI
Life of this patent
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AssigneeOki Electric Industry Co., Ltd.
InventorKengo KOIZUMI
Estimating the term…
The light source unit generates probe light. The splitting unit splits Brillouin backscattered light, which arise in the optical fiber under test owing to the probe light, into two branches of a first light path and a second light path. The delay unit gives a delay between light propagating through the first light path and the second light path. The multiplexer unit multiplexes light propagating through the first light path and the second light path to generate multiplexed light. The coherent detection unit performs heterodyne detection on the multiplexed light to output a difference frequency as a first electrical signal. The frequency shift amount obtaining unit performs homodyne detection on one of the two branches split from the first electrical signal and the second electrical signal having the same frequency as the frequency of the first electrical signal to obtain a frequency shift amount. The signal intensity obtaining unit generates intensity information of the first electrical signal as an intensity signal. The signal processing unit obtains strain δε and a temperature change δT separately from the frequency shift amount and the intensity.
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement apparatus comprising:
A measurement method comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.