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US 2017/0254705 A1Published application
Microbolometer contact systems and methods
AssigneeFLIR Systems, Inc.
InventorsEric A. Kurth, Patrick Franklin
Life of this patent
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Abstract
Systems and methods are directed to contacts for an infrared detector. For example, an infrared imaging device includes a substrate having a first metal layer and an infrared detector array coupled to the substrate via a plurality of contacts. Each contact includes for an embodiment a plurality of metal studs each having a first end and a second end and each disposed between the first metal layer and a second metal layer, wherein the first end of each metal stud is disposed on a portion of the first metal layer that is at least partially on the surface of the substrate.
Claims1
An infrared imaging device comprising:
- a substrate having a first metal layer disposed at least partially on a surface of the substrate;
- and
- an infrared detector array coupled to the substrate via a plurality of contacts.
Dependencies are inferred from the claim text.