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AssigneeIntel Corporation
InventorsYael Yanai, Yehiel Shilo, Eli Kupermann, Chen-Hsun Wu, Elena Agranovsky, Marlon D. Bada
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Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.
A device with integral sensor testing during an initial movement of the device, wherein the device includes:
A method for testing a device during an initial movement of the device, comprising:
A method for testing a device on a manufacturing line, comprising:
Dependencies are inferred from the claim text.