Opportunistic memory tuning for dynamic workloads

A method for improving performance of a computing device, the method comprising:

• determining, via a firmware of the computing device and for an at least one operating memory device of the computing device, a plurality of performance characteristic sets, each of the plurality of performance characteristic sets having a corresponding configuration parameter set from a plurality of configuration parameter sets, each performance characteristic set of the plurality of performance characteristic sets associated with multiple performance characteristics for the at least one operating memory device, and each configuration parameter set of the plurality of configuration parameter sets defining multiple configurations parameters usable together for the at least one operating memory device;
• in response to a request for a computing device to execute an application, selecting a configuration parameter set of the plurality of configuration parameter sets for the at least one operating memory device of the computing device, the selecting based at least in part on performance characteristics for the application and further based at least in part on the performance characteristic set corresponding to the selected configuration parameter set;
• configuring, via the firmware, the computing device to operate the at least one operating memory device according to the selected configuration parameter set;
• and
• executing the application on the computing device, the application execution comprising at least one use of the configured at least one operating memory device selected from the group consisting of reading from the at least one operating memory device according to the selected configuration parameter set, and writing to the at least one operating memory device of the computing device,
• the determined plurality of performance characteristic sets determined based on a testing of the at least one operating memory device according to multiple configuration parameter sets,
• the testing of the at least one operating memory device comprising determining that at least one of the multiple configuration parameter sets is unsuitable for the at least one operating memory device, and
• the selected configuration parameter set includes configuration parameter selected from the group consisting of a clock frequency for the at least one operating memory device, and a clock cycle by clock cycle input/output specification for the at least one operating memory device.