Imaging systems having column readout circuitry with test data injection capabilities
AssigneeSemiconductor Components Industries, LLC
InventorCharles G. MYERS
Life of this patent
Estimating the term…
Loading patent…
AssigneeSemiconductor Components Industries, LLC
InventorCharles G. MYERS
Estimating the term…
An imaging system may include an array of image pixels and column readout circuits coupled to each column. The column readout circuits may include test data injection circuitry and converter circuitry coupled to column memory via switching circuits. The injection circuitry may enable the switching circuits so that pixel data is stored on the column memory as rows of an image frame. The injection circuitry may disable the switching circuits and may inject test bits onto the column memory while the switching circuits are disabled. The column memory may store the test bits as one or more rows of the image frame interspersed among rows of the pixel data. Verification circuitry coupled to the column readout circuits may process the test data bits in the image frame to verify proper functionality of some or all of the imaging system without disrupting normal imaging operations by the imaging system.
An imaging system comprising:
A method of operating an image sensor to generate an image frame, wherein the image sensor comprises an array of image pixels arranged in rows and columns and a column readout circuit coupled to a given column of the array, wherein the column readout circuit comprises column memory coupled to the given column of the array via a column switch, the method comprising:
A system, comprising:
Dependencies are inferred from the claim text.