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US 2016/0365262 A1Published application
Semiconductor fabrication facility data collection system
AssigneeHaws Corporation
InventorBenjamin R. Peek
Life of this patent
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Abstract
A system and method for collecting and analyzing real-time data generated by different semiconductor fabrication tools in a semiconductor fabrication facility, and allowing a user to access said data remote from the semiconductor fabrication facility.
Claims15
A fabrication data collection system comprising:
- a semiconductor tool data collection unit comprising:
- a data collector, a semiconductor fabrication tool, an energy monitor, and a fluid flow monitor;
- wherein the semiconductor fabrication tool includes sensors to output tool characteristics, and the tool characteristics output is communicated to the data collector;
- wherein the energy monitor outputs an amount of energy used by the semiconductor fabrication tool, and the energy monitor output is communicated to the data collector;
- wherein the fluid flow monitor outputs a fluid flow rate of the semiconductor fabrication tool, and the fluid flow rate output is communicated to the data collector;
- wherein the semiconductor tool data collection unit is configured to communicate the outputs to one more servers using a network switch, wherein the network switch is configured to receive a communication from one or more semiconductor tool data collection units;
- wherein the servers are configured to store the outputs and/or perform analysis on the one or more communications from the one or more semiconductor tool data collection units, and to connect to a public network through a secure firewall, such that one or more authorized users are remotely able to access information on the servers though the public network via the secure firewall.
4 more elements
Dependencies are inferred from the claim text.