Mask for deposition system and method for using the mask
AssigneeApplied Materials, Inc.
InventorsJohn Macneill WHITE, Robert Jan VISSER
Life of this patent
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AssigneeApplied Materials, Inc.
InventorsJohn Macneill WHITE, Robert Jan VISSER
Estimating the term…
Embodiments of the disclosure provide methods and apparatus for monitoring film properties on a substrate in-situ. In one embodiment, a deposition system is provided. The deposition system includes at least two deposition chambers, and a patterned mask designed specifically for each of the deposition chambers, wherein a first mask of the patterned masks has a first opening formed therethrough outside of a pattern formed thereon, and a second mask of the patterned masks has a first opening formed therethrough outside of a pattern formed thereon, the first opening of the second mask having a position on the second mask that is different than a position of the first opening on the first mask.
A deposition system, comprising:
A deposition system, comprising:
A method for forming a plurality of film layers on a substrate, comprising:
Dependencies are inferred from the claim text.