Substrate Mark Detection Apparatus and Substrate Mark Detection Method

A substrate mark detection apparatus, comprising:

• a processor;
• a memory;
• and
• one or more modules stored in the memory and configured for execution by the processor, the one or more module comprising instructions for:
• detecting a depth at which a mark is embedded in a substrate to be detected, and determining whether the substrate is valid or not according to the depth at which the mark is embedded in the substrate;
• parsing the mark to obtain parsed information in a case where the substrate is valid, querying pre-stored information corresponding to the mark, determining whether the parsed information conforms to the pre-stored information or not, and if yes, to extract the pre-stored information and output the pre-stored information;
• and
• removing the substrate, in a case where the substrate is invalid or the parsed information does not conform to the pre-stored information.

A substrate mark detection method, comprising:

• detecting a depth at which a mark is embedded in a substrate to be detected, and determining whether the substrate is valid or not according to the depth at which the mark is embedded in the substrate;
• parsing the mark to obtain parsed information in a case where the substrate is valid, querying pre-stored information corresponding to the mark, determining whether the parsed information conforms to the pre-stored information or not, and if yes, to extract the pre-stored information and output the pre-stored information;
• and
• removing the substrate, in a case where the substrate is invalid or the parsed information does not conform to the pre-stored information.