Embedded SONOS Based Memory Cells

A device, comprising:

• a non-volatile memory (NVM) transistor formed in a first region of a substrate, the NVM transistor comprising a channel and a gate stack on the substrate overlying the channel, the gate stack including a dielectric layer on the substrate and a charge-trapping layer on the dielectric layer and an oxide layer overlying the charge-trapping layer, a first gate overlying the oxide layer, and a first silicide region overlying the first gate;
• a metal-oxide-semiconductor (MOS) transistor formed in a second region of the substrate, the MOS transistor comprising a gate oxide overlying the substrate in the second region, a second gate overlying the gate oxide, and a second silicide region overlying the second gate;
• and
• a strain inducing structure overlying the NVM transistor and a surface of the substrate in the first region of the substrate.

A device, comprising:

• a NVM transistor formed in a first region of a substrate including a gate stack overlying a channel, a first gate overlying the gate stack, and a first silicide region overlying the first gate, wherein the gate stack includes a charge-trapping layer sandwiched between a top and a bottom dielectric layers;
• a MOS transistor pair formed in a second region of the substrate, wherein each of the MOS transistors includes a gate oxide overlying the substrate a second gate overlying the gate oxide, and a second silicide region overlying the second gate of each of the MOS transistors;
• and
• a strain inducing structure overlying the NVM transistor, the MOS transistor and surfaces of the substrate in the first and second regions of the substrate.

A memory cell, comprising:

• a Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) transistor formed in a first region of a substrate, the SONOS transistor comprising a channel and a gate stack on the substrate overlying the channel a first gate and a first silicide region overlying the gate stack, the gate stack including a dielectric layer on the substrate, a lower and an upper charge-trapping layers on the dielectric layer, and an oxide layer overlying the upper charge-trapping layer;
• at least one metal-oxide-semiconductor (MOS) transistor formed in a second region of the substrate, each of the at least one MOS transistor comprising a gate oxide overlying the substrate, a second gate and a second silicide region overlying the gate oxide in the second region;
• and
• a strain inducing structure formed at least directly over and in direct contact with the first silicide region of the SONOS transistor and the second silicide region of each of the at least one MOS transistor.