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US 2016/0260701 A1Published application
Esd snapback based clamp for finfet
AssigneeGlobalfoundries Inc.
InventorsJagar SINGH, Andy WEI, Mahadeva Iyer NATARAJAN, Manjunatha PRABHU, Anil KUMAR
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Abstract
There is set forth herein a field effect transistor (FET) configured as an ESD protection device. In one embodiment, the FET can be configured to operate in a snapback operating mode. The FET can include a semiconductor substrate, a gate formed on the substrate and a dummy gate formed on the substrate spaced apart from the gate.
Claims21
-12. (canceled)
A method for fabricating a field effect transistor for use as an ESD protection device, the method comprising:
- patterning a gate and a spaced apart dummy gate on a substrate;
- forming a source diffusion region in the substrate;
- forming a first drain diffusion region in the substrate between the gate and the dummy gate,
- forming a second drain diffusion region in the substrate spaced apart from the first diffusion region and having a section spaced farther from the gate than the dummy gate;
- doping the substrate to form a doped region that merges the first drain diffusion region and the second drain diffusion region and to form a non-doped region that extends between the source diffusion region and the first drain diffusion region below the gate;
- and
- forming a contact on a drain having the second drain diffusion region.
4 more elements
Dependencies are inferred from the claim text.