Talbot effect based nearfield diffraction for spectral filtering
AssigneeKoninklijke Philips N.V.
InventorsEWALD ROESSL, THOMAS KOEHLER
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AssigneeKoninklijke Philips N.V.
InventorsEWALD ROESSL, THOMAS KOEHLER
Estimating the term…
The invention relates to a grating arrangement and a method for spectral filtering of an X-ray beam (B), the grating arrangement comprising: a dispersive element (10) comprising a prism configured to diffract the X-ray beam (B) into a first beam component (BC1) comprising a first direction (D1) and a second beam component comprising (BC2) a second direction (D2), tilted with respect to the first direction; a first grating (20) configured to generate a first diffraction pattern (DP1) of the first beam component (BC1) and a second diffraction pattern (DP2) of the second beam component (BC2), the second diffraction pattern (DP2) shifted with respect to the first diffraction patter (DP1); and a second grating (30) comprising at least one opening (31) which is aligned along a line (d) from a maximum (MA) to a minimum (MI) of intensity of the first diffraction pattern (DP1) or of the second diffraction pattern (DP2).
A grating arrangement for spectral filtering of an X-ray beam (B), comprising:
A method for spectral filtering of an X-ray beam (B), comprising the steps of:
Dependencies are inferred from the claim text.