Memory power selection using local voltage regulators

An apparatus, comprising:

• switch logic configured to control a switch to select between a source voltage and a local voltage as a power source for a memory sub-array, wherein the switch logic is configured to control the switch according to a memory operation being tested;
• a local voltage regulator in the memory sub-array that generates the local voltage;
• and
• test logic configured to control the memory sub-array to iteratively perform the test memory operation with the local voltage powering the memory sub-array, wherein the local voltage is different from the source voltage.

A method, the method comprising:

• switching from a source voltage to a local voltage for powering a memory sub-array, wherein the source voltage is provided by a host device to the memory sub-array and the local voltage is generated at the memory sub-array;
• performing a test memory operation while the memory sub-array is powered using the local voltage, wherein performing the test memory operation uses a test input to the memory sub-array and produces an output that isolates the test memory operation being performed while the memory sub-arrayed is powered using the local voltage;
• and
• comparing the test input with the output to identify memory cells in the memory sub-array that produce an error for the test memory operation, wherein comparing the test input with the output identifies which memory cells in the memory sub-array fail to operate with the memory sub-array powered using the local voltage.