Updating reliability data
AssigneeMicron Technology, Inc.
InventorsSaeed Sharifi Tehrani, Nicholas J. Richardson
Life of this patent
Estimating the term…
Abstract
The present disclosure includes apparatuses and methods related to updating reliability data. A number of methods can include receiving, at a variable node, either a first reliability data value with a first hard data value or a second reliability data value with a second hard data value, sending the first hard data value or the second hard data value to each check node coupled to the variable node according to a parity check code, and updating the reliability data based on input from less than all of the check nodes.
Claims20
An apparatus, comprising:
- a memory device;
- a reliability circuit coupled to the memory device and configured to receive hard data from the memory device and to determine reliability data assigned thereto, the reliability data comprising a first reliability data value in response to the hard data comprising a first value or comprising a second reliability data value in response to the hard data comprising a second value;
- an error correction circuit coupled to the reliability circuit and configured to receive the hard data and the reliability data from the reliability circuit, wherein the error correction circuit is further configured to:
- iteratively compute parity data for the hard data;
- and
- increment or decrement the reliability data once per L-number of layers of parity data, wherein one iteration includes a plurality of layers of parity data.
An apparatus, comprising:
- a plurality of circulant memories;
- a plurality of check nodes coupled to the plurality of circulant memories according to a parity check code;
- and
- wherein the plurality of circulant memories are each configured to provide respective hard data and respective reliability data to those of the plurality of check nodes coupled thereto;
- and
- wherein the plurality of check nodes are each configured to compute parity data for received hard data, update received reliability data based at least in part on the parity data, and send the parity data and updated reliability data to those of the circulant memories coupled thereto.
A method, comprising:
- determining, with a reliability circuit, reliability data assigned to hard data received from a memory device, the reliability data comprising a first reliability data value in response to the hard data comprising a first value or comprising a second reliability data value in response to the hard data comprising a second value;
- iteratively computing parity data for the hard data received from the reliability circuit with an error correction circuit;
- and
- incrementing or decrementing the reliability data received from the reliability circuit with the error correction circuit once per L-number of layers of parity data, wherein one iteration includes a plurality of layers of parity data.
A method, comprising:
- providing, from each of a plurality of circulant memories, respective hard data and respective reliability data to those of a plurality of check nodes coupled thereto;
- computing parity data for received hard data with each of a plurality of check nodes;
- updating received reliability data based at least in part on the parity data with each of a plurality of check nodes;
- and
- sending, from each of the plurality of check nodes, the parity data and updated reliability data to those of the circulant memories coupled thereto.
Dependencies are inferred from the claim text.